| /******************************************************************************* | |
| * (c) Copyright 2008 Actel Corporation. All rights reserved. | |
| * | |
| * Manufacturing Test Data data structures. | |
| * This header files specified the layout of the various data structures used | |
| * to store manaufacturing test data within eNVM. | |
| * | |
| * SVN $Revision: 700 $ | |
| * SVN $Date: 2009-03-13 13:22:03 +0000 (Fri, 13 Mar 2009) $ | |
| */ | |
| #ifndef MTD_DATA_H | |
| #define MTD_DATA_H | |
| #include <stdint.h> | |
| #ifdef __cplusplus | |
| extern "C" { | |
| #endif | |
| /* | |
| * Analog block specifications | |
| */ | |
| #define NB_OF_QUADS 6 | |
| #define NB_OF_ABPS_PER_QUAD 2 | |
| #define TOTAL_NB_OF_ABPS (NB_OF_QUADS * NB_OF_ABPS_PER_QUAD) | |
| #define NB_OF_ABPS_RANGES 4 | |
| #define NB_OF_ANALOG_MODULES 3 | |
| #define NB_OF_OBD_MODES 2 | |
| #define NB_OF_QUADS_PER_MODULE 2 | |
| #define NB_OF_CHOPPING_OPTIONS 2 | |
| #define NB_OF_DIRECT_INPUTS_PER_ADC 4 | |
| #define NB_OF_ADC_CHANNELS 13 | |
| /*------------------------------------------------------------------------------ | |
| * mtd_global_settings_t | |
| *------------------------------------------------------------------------------ | |
| * This typedef specifies the layout of the data structure holding the | |
| * manufacturing test data global settings. | |
| */ | |
| typedef struct __mtd_global_settings_t | |
| { | |
| uint16_t crc16; | |
| uint8_t serial[6]; | |
| uint32_t revision; | |
| uint16_t sram_repair[8]; | |
| uint16_t varef_m; | |
| uint16_t spare; | |
| uint8_t big_dec; | |
| uint8_t reserved0; | |
| uint16_t reserved1; | |
| } mtd_global_settings_t; | |
| /*------------------------------------------------------------------------------ | |
| * mtd_abps_trim_t | |
| *------------------------------------------------------------------------------ | |
| * The following data structure is used to store ABPS trimming information. | |
| */ | |
| typedef struct __mtd_abps_trim_t | |
| { | |
| uint8_t dacdec; | |
| uint8_t negtrim_per4_per3b_gtdec; | |
| } mtd_abps_trim_t; | |
| /*------------------------------------------------------------------------------ | |
| * mtd_calibration_mc_t | |
| *------------------------------------------------------------------------------ | |
| * The following data structure is used to store M and C calibration | |
| * coefficients. | |
| */ | |
| typedef struct __mtd_calibration_mc_t | |
| { | |
| uint16_t m; | |
| uint16_t c; | |
| } mtd_calibration_mc_t; | |
| /*------------------------------------------------------------------------------ | |
| * mtd_data_t | |
| *------------------------------------------------------------------------------ | |
| * The following data structure is used to hold the full set of manufacturing | |
| * test data. | |
| */ | |
| typedef struct __mtd_data_t | |
| { | |
| mtd_global_settings_t global_settings; | |
| mtd_abps_trim_t abps_trimming[NB_OF_QUADS][NB_OF_ABPS_PER_QUAD][NB_OF_ABPS_RANGES]; | |
| uint8_t odb_trimming[NB_OF_ANALOG_MODULES][NB_OF_OBD_MODES][NB_OF_CHOPPING_OPTIONS]; | |
| mtd_calibration_mc_t abps_calibration[NB_OF_QUADS][NB_OF_ABPS_PER_QUAD][NB_OF_ABPS_RANGES]; | |
| mtd_calibration_mc_t obd_calibration[NB_OF_ANALOG_MODULES][NB_OF_OBD_MODES][NB_OF_CHOPPING_OPTIONS]; | |
| mtd_calibration_mc_t cm_calibration[NB_OF_QUADS]; | |
| mtd_calibration_mc_t tm_calibration[NB_OF_QUADS]; | |
| mtd_calibration_mc_t quads_direct_input_cal[NB_OF_QUADS][2]; | |
| mtd_calibration_mc_t adc_direct_input_cal[NB_OF_ANALOG_MODULES][NB_OF_DIRECT_INPUTS_PER_ADC]; | |
| uint16_t comparators_offsets[NB_OF_QUADS]; | |
| uint32_t ccc_delays_cal; | |
| } mtd_data_t; | |
| #ifdef __cplusplus | |
| } | |
| #endif | |
| #endif |