| About the Tests |
| --------------- |
| |
| The following tests are from the original version, updated simply for speed |
| and rewritten to fit the new framework of the program. These tests will |
| mainly catch memory errors due to bad bits which are permanently stuck high |
| or low: |
| Random value |
| XOR comparison |
| SUB comparison |
| MUL comparison |
| DIV comparison |
| OR comparison |
| AND comparison |
| |
| The following tests were implemented by me, and will do a slightly better job |
| of catching flaky bits, which may or may not hold a true value: |
| Sequential Increment |
| Block Sequential |
| Solid Bits |
| |
| The remaining tests were also implemented by me, and are designed to catch |
| bad bits which are dependent on the current values of surrounding bits in either |
| the same word32, or in the preceding and succeeding word32s. |
| Bit Flip |
| Checkerboard |
| Walking Ones |
| Walking Zeroes |
| Bit Spread |
| |
| There is also a test (Stuck Address) which is run first. It determines if the |
| memory locations the program attempts to access are addressed properly or not. |
| If this test reports errors, there is almost certainly a problem somewhere in |
| the memory subsystem. Results from the rest of the tests cannot be considered |
| accurate if this test fails: |
| Stuck Address |
| |
| Usage information is summarized in the file README, and in the man page. |
