| /************************************************************************ |
| * Copyright (C) 2012-2018, Focaltech Systems (R)£¬All Rights Reserved. |
| * |
| * File Name: focaltech_test.h |
| * |
| * Author: Focaltech Driver Team |
| * |
| * Created: 2016-08-01 |
| * |
| * Abstract: test entry for all IC |
| * |
| ************************************************************************/ |
| #ifndef _TEST_LIB_H |
| #define _TEST_LIB_H |
| |
| /***************************************************************************** |
| * Included header files |
| *****************************************************************************/ |
| |
| #include <linux/kernel.h> |
| #include <linux/module.h> |
| #include <linux/slab.h> |
| #include <linux/debugfs.h> |
| #include <asm/uaccess.h> |
| #include <linux/i2c.h>//iic |
| #include <linux/delay.h>//msleep |
| #include <linux/string.h> |
| #include <asm/unistd.h> |
| #include <linux/vmalloc.h> |
| |
| #include "../focaltech_core.h" |
| #include "focaltech_test_detail_threshold.h" |
| #include "focaltech_test_ini.h" |
| |
| /***************************************************************************** |
| * Macro definitions using #define |
| *****************************************************************************/ |
| #define FTS_INI_FILE_PATH "/mnt/sdcard/" |
| #define FTS_TESTDATA_FILE_NAME "testdata.csv" |
| #define FTS_TESTRESULT_FILE_NAME "testresult.txt" |
| #define false 0 |
| #define true 1 |
| #define MAX_IC_NAME_LEN 20 |
| #define TEST_ICSERIES_LEN 8 |
| #define TEST_ICSERIES(x) ((x) >> TEST_ICSERIES_LEN) |
| |
| #define TEST_OPEN_MAX_VALUE 255 |
| #define MAX_TEST_ITEM 20 |
| #define BYTES_PER_TIME 32 //max:128 |
| #define FTS_TEST_STORE_DATA_SIZE 80*1024 |
| /*buff length*/ |
| #define BUFF_LEN_STORE_MSG_AREA 1024*10 |
| #define BUFF_LEN_MSG_AREA_LINE2 1024*4 |
| #define BUFF_LEN_STORE_DATA_AREA 1024*80 |
| #define BUFF_LEN_TMP_BUFFER 1024*16 |
| #define BUFF_LEN_TESTRESULT_BUFFER 1024*80*5 |
| |
| /*----------------------------------------------------------- |
| Error Code for Comm |
| -----------------------------------------------------------*/ |
| #define ERROR_CODE_OK 0x00 |
| #define ERROR_CODE_INVALID_COMMAND 0x02 |
| #define ERROR_CODE_INVALID_PARAM 0x03 |
| #define ERROR_CODE_WAIT_RESPONSE_TIMEOUT 0x07 |
| #define ERROR_CODE_COMM_ERROR 0x0c |
| #define ERROR_CODE_ALLOCATE_BUFFER_ERROR 0x0d |
| |
| /*----------------------------------------------------------- |
| Test Status |
| -----------------------------------------------------------*/ |
| #define RESULT_NULL 0 |
| #define RESULT_PASS 1 |
| #define RESULT_NG 2 |
| |
| /* |
| * factory test registers |
| */ |
| #define ENTER_WORK_FACTORY_RETRIES 5 |
| #define KEY_NUM_MAX 6 |
| |
| #define START_SCAN_RETRIES_INCELL 20 |
| #define START_SCAN_RETRIES_DELAY_INCELL 16 |
| #define FACTORY_TEST_RETRY 50 |
| #define FACTORY_TEST_DELAY 18 |
| #define FACTORY_TEST_RETRY_DELAY 100 |
| |
| #define DEVIDE_MODE_ADDR 0x00 |
| #define REG_FW_VERSION 0xA6 |
| #define REG_VA_TOUCH_THR 0x80 |
| #define REG_VKEY_TOUCH_THR 0x82 |
| |
| #define FACTORY_REG_LINE_ADDR 0x01 |
| #define FACTORY_REG_CHX_NUM 0x02 |
| #define FACTORY_REG_CHY_NUM 0x03 |
| #define FACTORY_REG_CLB 0x04 |
| |
| #define FACTORY_REG_DATA_SELECT 0x06 |
| #define FACTORY_REG_RAWBUF_SELECT 0x09 |
| #define FACTORY_REG_KEY_CBWIDTH 0x0B |
| #define FACTORY_REG_PARAM_UPDATE_STATE 0x0E |
| #define FACTORY_REG_SHORT_TEST_EN 0x0F |
| #define FACTORY_REG_SHORT_TEST_STATE 0x10 |
| #define FACTORY_REG_LCD_NOISE_START 0x11 |
| #define FACTORY_REG_LCD_NOISE_FRAME 0x12 |
| #define FACTORY_REG_LCD_NOISE_NUMBER 0x13 |
| #define FACTORY_REG_CB_ADDR_H 0x18 |
| #define FACTORY_REG_CB_ADDR_L 0x19 |
| |
| #define FACTORY_REG_LEFT_KEY 0x1E |
| #define FACTORY_REG_RIGHT_KEY 0x1F |
| #define FACTORY_REG_GIP_DRIVER_MODE 0x20 |
| #define FACTORY_REG_SOURCE_DRIVER_MODE 0x21 |
| #define FACTORY_REG_K1 0x31 |
| #define FACTORY_REG_K2 0x32 |
| #define FACTORY_REG_RAWDATA_ADDR 0x6A |
| #define FACTORY_REG_CB_ADDR 0x6E |
| #define FACTORY_REG_SHORT_ADDR 0x89 |
| #define FACTORY_REG_RAWDATA_TEST_EN 0x9E |
| #define FACTORY_REG_CB_TEST_EN 0x9F |
| #define FACTORY_REG_OPEN_TEST_EN 0xA0 |
| |
| #define TEST_RETVAL_00 0x00 |
| #define TEST_RETVAL_AA 0xAA |
| |
| /***************************************************************************** |
| * enumerations, structures and unions |
| *****************************************************************************/ |
| struct test_funcs { |
| u32 ic_series; |
| void (*init_testitem)(char *); |
| void (*init_basicthreshold)(char *); |
| void (*init_detailthreshold)(char *); |
| void (*set_testitem_sequence)(void); |
| bool (*start_test)(void); |
| }; |
| |
| struct test_ic_type { |
| char ic_name[MAX_IC_NAME_LEN]; |
| u8 len; |
| u32 ic_type; |
| }; |
| |
| /* |
| * selected_ic - ic type need test |
| * normalize - auto normalize or overall normalize |
| * tx_num - tx number |
| * rx_num - rx number |
| * channels_num - for 6x36 |
| * key_num - actually key number used |
| * key_num_total - equal max key number |
| * used_max_tx_num - tx_num <= used_max_tx_num |
| * used_max_rx_num - rx_num <= used_max_rx_num |
| * left_key1/2/3 - left key flag |
| * right_key1/2/3 - right key flag |
| */ |
| struct screen_setting { |
| int selected_ic; |
| int normalize; |
| int tx_num; |
| int rx_num; |
| u8 channels_num; |
| u8 key_num; |
| u8 key_num_total; |
| u8 key_flag; |
| int used_max_tx_num; |
| int used_max_rx_num; |
| |
| bool left_key1; |
| bool left_key2; |
| bool left_key3; |
| bool left_key4; |
| bool right_key1; |
| bool right_key2; |
| bool right_key3; |
| }; |
| |
| /* |
| * itemtype - |
| * testnum - Test number |
| * testresult - Test result, NG\PASS\TESTING |
| * itemcode - Test item code |
| */ |
| struct test_item { |
| u8 itemtype; |
| u8 testnum; |
| u8 testresult; |
| u8 itemcode; |
| }; |
| |
| /* |
| * test_num - test item numbers |
| * testresult - test result write to testresult.txt |
| * testresult_len - length of testresult |
| * va_touch_thr - touch threshold in va |
| * key_touch_thr - touch threshold in key |
| * buffer - save detail data temporary |
| * ini_ic_name - ic name of ini file |
| * ini_keyword_num - keyword line number of ini file |
| * ini_data - save ini data as struct _ini_data |
| * func - test main function |
| * test_item - save whole test item |
| * screen_param - test basic parameter: tx/rx/key num... |
| */ |
| struct fts_test_data { |
| int test_num; // test item num |
| char *store_all_data; // store all data in testdata.csv |
| char *tmp_buffer; // store temp buff in testdata.csv |
| char *store_msg_area; // store message in testdata.csv |
| int len_store_msg_area; // store message len in testdata.csv |
| char *msg_area_line2; // strore second line in testdata.csv |
| int len_msg_area_line2; //strore second line len in testdata.csv |
| char *store_data_area; // store data in testdata.csv |
| int len_store_data_area; // store data len in testdata.csv |
| u8 test_item_code; //TestItemCode in testdata.csv |
| int start_line; //The Start Line of Data Area |
| int test_data_count; // test data count in testdata.csv |
| char *testresult; |
| int testresult_len; |
| u8 va_touch_thr; |
| u8 key_touch_thr; |
| int *buffer; |
| char ini_ic_name[20]; |
| int ini_keyword_num; |
| struct _ini_data *ini_data; |
| struct test_funcs *func; |
| struct test_item test_item[MAX_TEST_ITEM]; |
| struct screen_setting screen_param; |
| struct detailthreshold_mcap mcap_detail_thr; // detailthreshold of MCap |
| struct detailthreshold_scap scap_detail_thr; // detailthreshold of SCap |
| struct detailthreshold_incell incell_detail_thr; // detailthreshold of Incell |
| }; |
| |
| /*----------------------------------------------------------- |
| * IC corresponding code, each of the IC code is 16 bit, high 8 |
| * bit on behalf of the same series, low 8 bit on behalf of the specific IC |
| *-----------------------------------------------------------*/ |
| enum ic_type { |
| IC_FT5X36 = 0x0000, |
| IC_FT5X36i = 0x0001, |
| IC_FT3X16 = 0x0002, |
| IC_FT3X26 = 0x0003, |
| |
| IC_FT5X46 = 0x0100, |
| IC_FT5X46I = 0x0101, |
| IC_FT5526 = 0x0102, |
| IC_FT3X17 = 0x0103, |
| IC_FT5436 = 0x0104, |
| IC_FT3X27 = 0x0105, |
| IC_FT5526I = 0x0106, |
| IC_FT5416 = 0x0107, |
| IC_FT5426 = 0x0108, |
| IC_FT5435 = 0x0109, |
| IC_FT7681 = 0x010A, |
| IC_FT7661 = 0x010B, |
| IC_FT7511 = 0x010C, |
| IC_FT7421 = 0x010D, |
| IC_FT7311 = 0x010E, |
| IC_FT3327DQQ_001 = 0x010F, |
| IC_FT5446DQS_W01 = 0x0110, |
| IC_FT5446DQS_W02 = 0x0111, |
| IC_FT5446DQS_002 = 0x0112, |
| IC_FT5446DQS_Q02 = 0x0113, |
| |
| IC_FT6X06 = 0x0200, |
| IC_FT3X06 = 0x0201, |
| |
| IC_FT6X36 = 0x0300, |
| IC_FT3X07 = 0x0301, |
| IC_FT6416 = 0x0302, |
| IC_FT6426 = 0x0303, |
| IC_FT7401 = 0x0304, |
| IC_FT3407U = 0x0305, |
| IC_FT6236U = 0x0306, |
| IC_FT6436U = 0x0307, |
| IC_FT3267 = 0x0308, |
| IC_FT3367 = 0x0309, |
| |
| IC_FT5X16 = 0x0400, |
| IC_FT5X12 = 0x0401, |
| |
| IC_FT5506 = 0x0500, |
| IC_FT5606 = 0x0501, |
| IC_FT5816 = 0x0502, |
| |
| IC_FT5822 = 0x0600, |
| IC_FT5626 = 0x0601, |
| IC_FT5726 = 0x0602, |
| IC_FT5826B = 0x0603, |
| IC_FT3617 = 0x0604, |
| IC_FT3717 = 0x0605, |
| IC_FT7811 = 0x0606, |
| IC_FT5826S = 0x0607, |
| IC_FT3517U = 0x0608, |
| |
| IC_FT5306 = 0x0700, |
| IC_FT5406 = 0x0701, |
| |
| IC_FT3C47U = 0x0800, |
| |
| IC_FT3D47 = 0x0900, |
| |
| IC_FT5442 = 0x0A00, |
| |
| IC_FT3428U = 0x0B00, |
| |
| IC_FT5452 = 0x0C00, |
| IC_FT3518 = 0x0C01, |
| IC_FT3558 = 0x0C02, |
| |
| IC_FT8606 = 0x8000, |
| |
| IC_FT8716 = 0x8100, |
| IC_FT8716U = 0x8101, |
| IC_FT8613 = 0x8102, |
| IC_FT8716F = 0x8103, |
| |
| IC_FT8607 = 0x8200, |
| IC_FT8607U = 0x8201, |
| |
| IC_FT8707 = 0x8300, |
| |
| IC_FT8736 = 0x8400, |
| |
| IC_FTE716 = 0x8500, |
| |
| IC_FT8006M = 0x8600, |
| IC_FT7250 = 0x8601, |
| |
| IC_FTE736 = 0x8700, |
| |
| IC_FT8006U = 0x8800, |
| |
| IC_FT8201 = 0x8900, |
| |
| IC_FT8719 = 0x8A00, |
| IC_FT8615 = 0x8A01, |
| |
| IC_FT8739 = 0x8B00, |
| }; |
| |
| enum normalize_type { |
| OVERALL_NORMALIZE = 0, |
| AUTO_NORMALIZE = 1, |
| }; |
| |
| enum NodeType { |
| NODE_INVALID_TYPE = 0, |
| NODE_VALID_TYPE = 1, |
| NODE_KEY_TYPE = 2, |
| NODE_AST_TYPE = 3, |
| }; |
| |
| /***************************************************************************** |
| * Global variable or extern global variabls/functions |
| *****************************************************************************/ |
| extern struct test_funcs test_func_ft8201; |
| extern struct test_funcs *test_funcs_list[]; |
| extern struct test_ic_type ic_types[]; |
| extern struct fts_test_data test_data; |
| |
| int init_test_funcs(u32 ic_type); |
| u32 fts_ic_table_get_ic_code_from_ic_name(char *strIcName); |
| void sys_delay(int ms); |
| int focal_abs(int value); |
| u8 fts_i2c_read_write(unsigned char *writebuf, int writelen, unsigned char *readbuf, int readlen); |
| int fts_test_i2c_read(u8 *writebuf, int writelen, u8 *readbuf, int readlen); |
| int fts_test_i2c_write(u8 *writebuf, int writelen); |
| int read_reg(u8 addr, u8 *val); |
| int write_reg(u8 addr, u8 val); |
| int enter_work_mode(void); |
| int enter_factory_mode(void); |
| int read_mass_data(u8 addr, int byte_num, int *buf); |
| int chip_clb_incell(void); |
| int start_scan_incell(void); |
| int wait_state_update(void); |
| int get_rawdata_incell(int *data); |
| int get_cb_incell(u16 saddr, int byte_num, int *cb_buf); |
| int weakshort_get_adc_data_incell(u8 retval, u8 ch_num, int byte_num, int *adc_buf); |
| void show_data_incell(int *data, bool include_key); |
| bool compare_data_incell(int *data, int min, int max, int vk_min, int vk_max, bool include_key); |
| bool compare_detailthreshold_data_incell(int *data, int *data_min, int *data_max, bool include_key); |
| void save_testdata_incell(int *data, char *test_num, int index, u8 row, u8 col, u8 item_count); |
| void fts_set_testitem(unsigned char ucitemcode); |
| void *fts_malloc(size_t size); |
| void fts_free_proc(void *p); |
| int get_channel_num(void); |
| |
| #define fts_free(p) do {\ |
| if (p) {\ |
| fts_free_proc(p);\ |
| p = NULL;\ |
| }\ |
| } while(0) |
| |
| |
| #define FOCAL_TEST_DEBUG_EN 1 |
| #if (FOCAL_TEST_DEBUG_EN) |
| #define FTS_TEST_DBG(fmt, args...) do {printk("[FTS] [TEST]%s. line: %d. "fmt"\n", __FUNCTION__, __LINE__, ##args);} while (0) |
| #define FTS_TEST_FUNC_ENTER() printk("[FTS][TEST]%s: Enter(%d)\n", __func__, __LINE__) |
| #define FTS_TEST_FUNC_EXIT() printk("[FTS][TEST]%s: Exit(%d)\n", __func__, __LINE__) |
| #else |
| #define FTS_TEST_DBG(fmt, args...) do{}while(0) |
| #define FTS_TEST_FUNC_ENTER() |
| #define FTS_TEST_FUNC_EXIT() |
| #endif |
| |
| #define FTS_TEST_INFO(fmt, args...) do { printk(KERN_ERR "[FTS][TEST][Info]%s. line: %d. "fmt"\n", __FUNCTION__, __LINE__, ##args);} while (0) |
| #define FTS_TEST_ERROR(fmt, args...) do { printk(KERN_ERR "[FTS][TEST][Error]%s. line: %d. "fmt"\n", __FUNCTION__, __LINE__, ##args);} while (0) |
| |
| #define FTS_TEST_SAVE_INFO(fmt, args...) do { \ |
| if (test_data.testresult) { \ |
| test_data.testresult_len += snprintf( \ |
| test_data.testresult + test_data.testresult_len, \ |
| BUFF_LEN_TESTRESULT_BUFFER, \ |
| fmt, ##args);\ |
| }; \ |
| } while (0) |
| |
| #define FTS_TEST_SAVE_ERR(fmt, args...) do { \ |
| if (test_data.testresult) { \ |
| test_data.testresult_len += snprintf( \ |
| test_data.testresult + test_data.testresult_len, \ |
| BUFF_LEN_TESTRESULT_BUFFER, \ |
| fmt, ##args);\ |
| } \ |
| printk(KERN_ERR "[FTS][TEST][Error]%s. line: %d. "fmt"\n", __FUNCTION__, __LINE__, ##args);\ |
| } while (0) |
| #endif |
